Status: Fora de operação. Aguardando liberação de recursos para compra de peças.
email para contato: fegsem@cmnano.ufs.br
Veja neste link o Manual para exportar os dados e imagens obtidas no CMNano - UFS.
FEG-SEM (JSM7500F)
LABe™* - Low angle backscatter imaging
Eliminates charging effects
Allows for low kV backscattered electron imaging
Provides more surface detail & compositional contrast
Image Automation - allows 4 different signals to be simultaneously viewed with 16 bit imaging
r-Filter - allows variable energy filtering of secondary electrons and backscattered electrons
GB mode - provides extreme images at very low accelerating voltage
Automatic specimen exchange
Retractable in-lens BEI detector
Resolution
1.0nm (15kV)
1.4nm (1kV)
0.6nm (30kV) attainable
Accelerating Voltage
0.1 to 30 kV
Magnification
x25 to 1,000,000
(printed as a 120mm x 90mm micrograph)
Stage
Type I: X=70mm, Y=50mm
Type II: X=110mm, Y=80mm
Type III: X=140mm, Y=80mm