Status: Fora de operação. Aguardando liberação de recursos para compra de peças.

email para contato: fegsem@cmnano.ufs.br

Veja neste link o Manual para exportar os dados e imagens obtidas no CMNano - UFS.

FEG-SEM (JSM7500F)

LABe™* - Low angle backscatter imaging

  • Eliminates charging effects

  • Allows for low kV backscattered electron imaging

  • Provides more surface detail & compositional contrast

Image Automation - allows 4 different signals to be simultaneously viewed with 16 bit imaging

r-Filter - allows variable energy filtering of secondary electrons and backscattered electrons

GB mode - provides extreme images at very low accelerating voltage

  • Automatic specimen exchange

  • Retractable in-lens BEI detector

Resolution

  • 1.0nm (15kV)

  • 1.4nm (1kV)

  • 0.6nm (30kV) attainable

Accelerating Voltage

  • 0.1 to 30 kV

Magnification

  • x25 to 1,000,000

(printed as a 120mm x 90mm micrograph)

Stage

  • Type I: X=70mm, Y=50mm

  • Type II: X=110mm, Y=80mm

  • Type III: X=140mm, Y=80mm

Agenda de operação